The Transmission Electron Microscope (TEM) is a is a microscale, nanoscale, and atomic scale measurement and characterization tool that uses many different techniques on many different specimens. Unlike other techniques, it is capable of probing the atomic structure throughout the full thickness of the thin specimen (typically 10-50 nm) projected on the image plane, with a lateral resolution down to about 0.05 nm.

TEM generates and guides the electron beam that moves at relativistic speeds through a thin specimen. Due to this interaction with the specimen, the electrons are scattered and the signals generated by this interaction are detected. The final image is the result of interference pattern of the incident and diffracted beams.

The JEOL™ JEM-2010F​ Ultrahigh Resolution​ TEM/STEM is installed in a dedicated laboratory at the CNR-IOM Institute and made available for access as part of the NFFA-Trieste project. It is built by anchoring a concrete platform directly onto the karst rock with only weak links to the laboratory.

More information about the technique HERE.