Publications

From our users
ACS Appl. Mater. Inter., 12, 47556–47563, (2020)
Improved structural properties in homogeneously doped Sm0.4Ce0.6O2-δ epitaxial thin films: high doping effect on the electronic bands
N. Yang, D. Knez, G. Vinai, P. Torelli, R. Ciancio, P. Orgiani, and C. Aruta
Involved NFFA techniques:
lab-XPS, PLD, SEM, XPS, XAS/XMCD @ APE-HE, XRD
From our users
J. Elec. Spectr. Rel. Phenom., 146902, (2019)
Operando photoelectron emission spectroscopy and microscopy at Elettra soft X-ray beamlines: From model to real functional systems
M. Amati, V. Bonanni, L. Braglia, F. Genuzio, L. Gregoratti, M. Kiskinova, A. Kolmakov, A. Locatelli, E. Magnano, A.A. Matruglio, T.O. Menteş, S. Nappini, P. Torelli, P. Zeller
Involved NFFA technique:
Ambient pressure XAS @ APE-HE
From our users
Thin Solid Films, 674, 12-21, (2019)
Control of composition and grain growth in Cu2ZnSnS4 thin films from nanoparticle inks
N. Ataollahi, C. Malerba, E. Cappelletto, R. Ciancio, R. Edla, R. Di Maggio, P. Scardi
Involved NFFA techniques:
SEM, XPS, XAS/XMCD @ APE-HE
From our users
Sci. Data, 5, 180172, (2018)
The first annotated set of scanning electron microscopy images for nanoscience
R. Aversa, M.H. Modarres, S. Cozzini, R. Ciancio and A. Chiusole
Involved NFFA technique:
SEM