The doping of metal oxides is an interesting route to increase catalyst activity and lower activation temperatures in H2 dissociation to replace Pt in catalysts for electrochemical devices. In this process, the roles of both the matrix and dopant cations are fundamental to understanding and designing more efficient catalysts. In this work, we have investigated the reduction process in pure and doped CeO2 films. We followed the oxidation states of Ce and dopants (Cu and Fe) during H2 exposure at ambient pressure by combining X-ray absorption spectroscopy and gas chromatography on 5 nm films in the temperature range of 300–620 K. We have observed that Cu doping (at concentrations of 5 and 14 at. %) promotes the ceria reduction, while the addition of Fe seems to have a limited impact on the oxide chemical reactivity only at low temperatures. Moreover, thanks to the chemical sensitivity of operando X-ray absorption spectroscopy, we were able to follow simultaneously the evolution of Ce and Cu oxidation states during the reaction, which has permitted to identify two distinct reduction processes taking place above and below 500 K. These measurements show that at low temperatures, the H2 dissociation takes place at the Cu1+ sites, thus explaining the higher reactivity of the Cu-doped samples. The described mechanism can help in the design of Pt-free catalysts with enhanced performances.

Implementation of in-situ and operando experimental set-ups for bridging the pressure gap in characterization techniques based on monitoring of photoelectron emission has made significant achievements at several beamlines at Elettra synchrotron facility. These set-ups are now operational and have been successfully used to address unsolved issues exploring events occurring at solid–gas, solid–liquid and solid-solid interfaces of functional materials. The sections in the article communicate the research opportunities offered by the current set-ups at APE, BACH, ESCAmicroscopy and Nanospectroscopy beamlines and outline the next steps to overcome the present limits.

Le proprietà ottiche, elettroniche e magnetiche dei solidi e delle loro superfici dipendono dalla struttura degli stati elettronici entro alcuni eV dal livello di Fermi. I calcoli della struttura elettronica a bande sono efficaci solo nel caso di materiali a bassa interazione elettrone-elettrone (correlazione). L'esperimento e la guida necessaria per lo studio delle proprietà elettroniche dei solidi e delle loro superfici, ed in particolare la spettroscopia di fotoemissione (photoemission spectroscopy - PES) che si basa sulla misura dello spettro energetico degli elettroni emessi da un solido eccitato da un fascio di fotoni monocromatici di energia eccedente la funzione lavoro. La risoluzione dell'angolo di emissione (Angle-resolved photemission spectroscopy - ARPES) permette di avere informazioni sulla legge di dispersione E_n(k) dello stato elettronico iniziale, mentre la misura del grado di polarizzazione in spin del fascio di elettroni completa il set di numeri quantici, fornendo un dato molto importante per lo studio delle correlazioni elettroniche.