SrVO3 (SVO) transparent conductive oxide (TCO) thin film, both visible-range optically transparent and highly conductive, shows great potential as a viable alternative to standard ITO (indium tin oxide) in various applications. In this study, our researchers investigated the surface stability of SVO under different gaseous atmospheres, particularly water, using spectroscopy characterizations such as x-ray photoemission (XPS) and operando ambient pressure x-ray absorption spectroscopy (XAS) techniques. Their findings reveal the formation of a few nanometer-thick insulating Sr-rich V5+ layer on the surface of the SVO film over time. To restore the TCO properties, this work demonstrates for the very first time that this undesired phase can be effectively removed through a water etching process, which is successful in both liquid and vapor forms.

The combination of operando/in situ X-Ray spectroscopies and DFT calculations allowed to clarify the role of SnOx surface content in NixSny intermetallic compounds in enhancing their selectivity to H2 during catalytic methanol decomposition reaction.