Surface & Nano Science Lab

UHV sample preparation chamber

Connected stations to prepare samples and to characterize them before and/or after spectroscopy



These UHV stations are connected to APE-HE and APE-LE end-stations with UHV transfer systems, in order to prepare samples and characterize them before and/or after the electron spectroscopy with synchrotron light. The sample preparation chamber is equipped with an ion gun, heating stages, evaporators (PVD), a thickness monitor,  LEED (Low Energy Electron Diffraction) and AES (Auger Electron Spectroscopy) system, and Kerr magnetometers. It enable users to clean single crystals, grow thin epitaxial films and measure the long range order of the surface structure, surface composition and magnetic property.

Our atomic resolution STM (Scanning Tunneling Microscope)​ is a powerful tool to measure real space surface structures, with and without long range order, immediately after the sample preparation. It is also used for quantitative analysis of film thickness in submonolayer range grown in the preparation chamber.

The sample preparation chamber (right) and the STM chamber
Topographic STM image for Fe dots deposited on (Bi0.9Mn0.1)2Te3 surface. (I. Vobornik et al, J. Phys. Chem. C118, 2014, 12333)
Out of plane (a) and in plane (b) magnetic hysteresis curves for Fe films grown on O/Cu(332), measured with Magnetic Optical Kerr Effect. (C.V. Barbosa et al, New J. Phys. 11 2009 113046)