These UHV stations are connected to APE-HE and APE-LE end-stations with UHV transfer systems, in order to prepare samples and characterize them before and/or after the electron spectroscopy with synchrotron light. The sample preparation chamber is equipped with an ion gun, heating stages, evaporators (PVD), a thickness monitor,  LEED (Low Energy Electron Diffraction) and AES (Auger Electron Spectroscopy) system, and Kerr magnetometers. It enable users to clean single crystals, grow thin epitaxial films and measure the long range order of the surface structure, surface composition and magnetic property.

Our atomic resolution STM (Scanning Tunneling Microscope)​ is a powerful tool to measure real space surface structures, with and without long range order, immediately after the sample preparation. It is also used for quantitative analysis of film thickness in submonolayer range grown in the preparation chamber.