Publications

From our users
J. Elec. Spectr. Rel. Phenom., 146902, (2019)
Operando photoelectron emission spectroscopy and microscopy at Elettra soft X-ray beamlines: From model to real functional systems
M. Amati, V. Bonanni, L. Braglia, F. Genuzio, L. Gregoratti, M. Kiskinova, A. Kolmakov, A. Locatelli, E. Magnano, A.A. Matruglio, T.O. Menteş, S. Nappini, P. Torelli, P. Zeller
Involved NFFA technique:
Ambient pressure XAS @ APE-HE