Chiara Bigi worked within NFFA-Trieste as University of Milan PhD student and CNR-IOM Post-doc from October 2019 to August 2020.
She is currently working as Research Fellow in Experimental Condensed Matter Physics at University of St Andrews, Scotland.
Chiara Bigi's research interests were mainly focused on the investigation of the electronic and spin properties of topological insulators, both single crystal and thin films, and 2D systems. During her master thesis she contributed to technical test and characterization of VLEED spectrometers of the new SP-ARPES device at APE-NFFA beamline and was involved in the study of electronic properties of both Bi2Se3 and oxides thin films grown in-situ by Pulsed Laser Deposition.
We present the results of a photon energy and polarization dependent angle-resolved photoemission spectroscopy (ARPES) study on high quality, epitaxial SrNbO3 thin films prepared in situ by pulsed laser deposition (PLD). We show that the Fermi surface is composed of three bands mainly due to t(2g) orbitals of Nb 4d, in analogy with the 3d-based perovskite systems. The bulk band dispersion for the conduction and valence states obtained by density functional theory (DFT) is generally consistent with the ARPES data. The small discrepancy in the bandwidth close to the Fermi level seems to result from the interplay of correlation effects and the presence of vacancies. The ARPES results are complemented by soft x-ray photoemission spectroscopy measurements in order to provide indications on the chemical states and the stoichiometry of the material.
Appl. Surf. Sci., 473, 190-193, (2019)
Robustness of topological states in Bi2Se3 thin film grown by Pulsed Laser Deposition on (0 0 1)-oriented SrTiO3 perovskite
C. Bigi, P. Orgiani, A. Nardi, A. Troglia, J. Fujii, G. Panaccione, I. Vobornik, G. Rossi
We report on the reproducible surface topological electron states in Bi2Se3 topological insulator thin films when epitaxially grown by Pulsed Laser Deposition (PLD) on (0 0 1)-oriented SrTiO3 (STO) perovskite substrates. Bi2Se3 has been reproducibly grown with single (0 0 1)-orientation and low surface roughness as controlled by ex-situ X-ray diffraction and in situ scanning tunnel microscopy and low-energy electron diffraction. Finally, in situ synchrotron radiation angle-resolved photo-emission spectroscopy measurements show a single Dirac cone and Dirac point at eV located in the center of the Brillouin zone likewise found from exfoliated single-crystals. These results demonstrate that the topological surface electron properties of PLD-grown Bi2Se3 thin films grown on (0 0 1)-oriented STO substrates open new perspectives for applications of multi-layered materials based on oxide perovskites.
University of Milan PhD Thesis, (2019)
Understanding the electronic properties of quantum materials by means of photoemission with angular and spin resolution
This thesis contains a selection of the results on the shallow electron states of quantum materials that I obtained as doctoral student of the Scuola di Dottorato in Fisica, Astrofisica e Fisica Applicata at the Università degli Studi di Milano. I carried out my doctoral research activity mostly at the TASC-IOM CNR laboratory, in the framework of the NFFA and APE-beamline facilities (Elettra Sincrotrone Trieste), as well in dedicated sessions at the I2; beamline of the Diamond light source, Harwell Campus, UK. To access the electronic properties of materials I specialised myself in photoemission spectroscopy techniques. High quality samples are a prerequisite for any attempt to study quantum materials so that a major effort in my PhD project has been to master the growth of novel quantum materials by means of Pulsed Laser Deposition (PLD). Given that the PLD is integrated in the suite of UHV facilities attached in-situ to the APE beamline, I directly characterised the electronic properties of the PLD grown samples exploiting both the spectroscopic techniques available at the beamline (ARPES, X-ray photoemission and absorption spectroscopies: XPS and XAS), either ex-situ structural characterisation tools (X-ray diffraction –XRD– and X-ray reflectivity, XRR).
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NFFA is a Progetto Internazionale financed by MIUR through CNR
(Istituto Officina dei Materiali, Trieste) and Elettra-Sincrotrone Trieste
and managed by the Commissione NFFA chaired by Giorgio Rossi
(Università di Milano and IOM-CNR).